MultiMode Scanning Probe Microscope (SPM), with Nanoscope 1 controller (not showing) performs the full range of atomic force microscopy (AFM), including electrostatic force microscopy (EFM), scanning gate microscopy (SGM) and scanning tunneling microscopy (STM) in air. |
MultiMode Scanning Probe Microscope (SPM), with Nanoscope 2 controller is used to study topographical, electrical and magnetic properties of nanostructures. |
